Selective Ru or Co Etch for 3nm Applications

Article Preview

Abstract:

Selective Cobalt (Co) and Ruthenium (Ru) etch chemistries are developed to provide controlled etch options with various metallization, including Al, Cu, W, Co, Ru, TiN and TaN. The pH effects on Co, Cu and W etching are reported. Diluted acids, such as 1% HF and 1% HCl, demonstrate etch rate profiles suitable for selective Co vs. W etch applications. Ru etch chemistries are alkaline oxidative based and expanded to meet 3 nm and below integration needs. Versatile applications include highly boosted Ru etch rates for thermally annealed Ru layers and TiN compatible WNx or WCN selective etching at ultra-dilutions.

You might also be interested in these eBooks

Info:

Periodical:

Solid State Phenomena (Volume 314)

Pages:

307-311

Citation:

Online since:

February 2021

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2021 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] L. Broussous, K. Hoarau, C. de Buttet, S. Zoll, Oxygen control for wet clean process on single wafer platform, Solid State Phenomena, Vol. 255 (2016) 260-264.

DOI: 10.4028/www.scientific.net/ssp.255.260

Google Scholar

[2] C.S. Hsu, P.Y. Chen, Versatile aqueous chemistry for selective Ru or WNx etch and implant BARC removal in 5- and 3-nm applications, Vol. 282 (2018) 288-292.

DOI: 10.4028/www.scientific.net/ssp.282.288

Google Scholar

[3] M. Nakahara, S. Tsunekawa, K. Watanabe, T. Arai, T. Yunogami, K. Kuroki, Etching technique for ruthenium with a high etch rate and high selectivity using ozone gas, J. Vac. Sci, Technol. B, 19 (2001), 2133-2136.

DOI: 10.1116/1.1415517

Google Scholar

[4] Q.T. Le, E. Kesters, H. Philipsen and F. Holsteyns, Wet etching of ruthenium: effect of thermal annealing, 21st. Surface Preparation and Cleaning Conference (SPCC), Paper 01-06, April 2-3, 2019; Portland, OR, USA.

Google Scholar