HOME CONTACT

Username: Password:

> @scientific.net

Trends and New Applications of Thin Films

Materials Science Forum Volumes 287 - 288

• Papers
• Abstracts

• p3 Diagnostics in Reactive Plasmas with Optical Emission Spectroscopy, Probe Measurement and Energy-Mass Spectrometry   [ 659 K ]
  Authors: P. Awakowicz
• p23 Crystallography and Microstructure of Thin Films Studied by X-Ray and Electron Diffraction   [ 2 M ]
  Authors: Robert A. Schwarzer
• p61 Surface and Thin Film Analysis with Electron and Mass Spectrometric Techniques   [ 1 M ]
  Authors: A. Wucher
• p87 The Manufacture of Thin Film Transistors and Color Filters for Flat Liquid Crystal Displays   [ 522 K ]
  Authors: E. Lueder
• p97 Doping Diamonds and Diamond Films for Electronic Applications   [ 538 K ]
  Authors: R. Kalish
• p107 Recent Results on Reactive Magnetron Sputtering for High-Rate Deposition of Ceramic Compound Films   [ 441 K ]
  Authors: A. Billard, C. Frantz
• p119 Fabrication of Micro- and Nanostructures   [ 814 K ]
  Authors: R. Kassing
• p131 Modelling of PVC Processes   [ 582 K ]
  Authors: J. Machet, C. Gautier-Picard, P. Cledat, O. Piot
• p141 Real Time Optical Method of Stress Measurements in Thin Films   [ 298 K ]
  Authors: G. Moulard, G. Contoux, G. Motyl, M. Courbon
• p151 Spectroellipsometric Method for Process Monitoring of Semiconductor Thin Films and Interfaces   [ 353 K ]
  Authors: R. Brenot, Morten Kildemo, B. Drévillon