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Gettering and Defect Engineering in Semiconductor Technology

Solid State Phenomena Volumes 19 - 20

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• p475 Double-Channel X-Ray Standing Wave Technique for Impurity Atom Location in Multicomponent Crystals   [ 168 K ]
  Authors: E.Kh. Mukhamedzhanov
• p479 Spectroscopical and Electrical Evidences about Segregation Effects in Semiconductors   [ 497 K ]
  Authors: Sergio Pizzini, Maurizio Acciarri, Simona Binetti
• p493 DLTS of High-Resistivity Si   [ 298 K ]
  Authors: Eddy Simoen, C. Claeys, G. Huylebroeck, Paul Clauws
• p499 Evaluation of DLTS Measurements in the Case of "Broadened" Spectra or a Barrier Limited Capture Process   [ 315 K ]
  Authors: K. Tittelbach-Helmrich
• p505 B-Ion Implantation into Mo-Film for Shallow Junction Formation: DLTS Analyses on the p⁺/n Fabricated Diodes   [ 296 K ]
  Authors: Antonella Poggi, R. Angelucci, E. Susi, M. Merli
• p511 Electrical Evaluation of Silicon on Insulator Structures Formed by Oxygen Implantation by Means of Frequency Resolved Photoconductivity Measurements   [ 365 K ]
  Authors: F. Coromina, A. Pérez-Rodríguez, J.R. Morante, M.A. Lourenço, K.P. Homewood, P.L.F. Hemment
• p517 Nonlinear Recombination and Diffusion Processes in Si and GaAs   [ 229 K ]
  Authors: D. Noreika, V. Netiksis, M. Petrauskas, M. Lenzner
• p523 Carrier Recombination Processes in PbTe Films by Picosecond IR Excitation   [ 185 K ]
  Authors: R. Tomasiunas, R. Masteika, K. Tumkevicius, M. Petrauskas
• p529 Investigation on Electrical Contacts on N-Type Silicon   [ 299 K ]
  Authors: Antonio Castaldini, Daniela Cavalcoli, Anna Cavallini
• p535 Diagnostics of Defects from the Noise Spectra   [ 270 K ]
  Authors: V.M. Aroutyunyan, F.V. Gasparyan, S.V. Melkonyan
• p541 Statistical Analysis of the Assembly-Induced Degradation of the Silicon Device Parameters   [ 397 K ]
  Authors: F. Gaiseanu
• p551 Mechanical Strain Relaxation during Lattice-Mismatched Epitaxial Growth   [ 471 K ]
  Authors: A. Schlachetzki, H.-H. Wehmann
• p563 Interfacial Dislocations in the GaSb/GaAs (001) Heterostructure   [ 641 K ]
  Authors: A.M. Rocher
• p573 Si/Ge - Heterostructures - Stability of Strained Layer Superlattices   [ 242 K ]
  Authors: Erich Kasper
• p581 Distribution of Defects in InAs_1-x-ySb_xP_y-InAs DHs   [ 275 K ]
  Authors: T.S. Argunova, R.N. Kyutt, B.A. Matveev, S.S. Ruvimov, N.M. Stus', G.N. Talalakin