Gettering and Defect Engineering in Semiconductor Technology VII
Solid State Phenomena Volumes 57 - 58
doi:10.4028/www.scientific.net/SSP.57-58
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p519
New Possibility of Impurities Express Determination by Laser Element Spark-Analyzer (LESA)
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348 K
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Authors: T.M. Tkacheva, G.N. Petrov, D.V. Vlasov -
p525
Analytical Modeling of the Gold Diffusion Induced Modification of the Forward Current through P-N Silicon Junctions
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199 K
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Authors: F. Gaiseanu, M. Sachelarie, D. Sachelarie, Jaume Esteve
