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Papers by Author: Anna Cavallini

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Minority Carrier Diffusion Lengths in Multi-Crystalline Silicon Wafers and Solar Cells

Authors: Daniela Cavalcoli, Anna Cavallini, Marco Rossi, Kristian Peter

205

Correlation between Defects and Electrical Properties of 4H-SiC Based Schottky Diodes

Authors: Luciano Scaltrito, Samuele Porro, Fabrizio Giorgis, P. Mandracci, M. Cocuzza, C. Fabrizio Pirri, Carlo Ricciardi, Sergio Ferrero, G. Richieri, C. Sgorlon, Luigi Merlin, Anna Cavallini, Antonio Castaldini

455

Electron-Induced Damage Effects in 4H-SiC Schottky Diodes

Authors: Antonio Castaldini, Anna Cavallini, Filippo Nava, P.G. Fuochi, P. Vanni

439

Characterisation of Surface and Near-Surface Regions in High-Purity Cz Si

Authors: Antonio Castaldini, Daniela Cavalcoli, Anna Cavallini, T. Minarelli, E. Susi

747

Optical Properties of Oxygen Agglomerates in Silicon

Authors: Simona Binetti, Sergio Pizzini, E. Leoni, R. Somaschini, Antonio Castaldini, Anna Cavallini

Recombination Properties of Defects in Gallium Nitride

Authors: Antonio Castaldini, Anna Cavallini, L. Polenta, Giancarlo Salviati

Charged Particle Detection Properties of Epitaxial 4H-SiC Schottky Diodes

Authors: Filippo Nava, P. Vanni, G. Verzellesi, Antonio Castaldini, Anna Cavallini, L. Polenta, Roberta Nipoti, C. Donolato

757

About the Electrical Properties of Oxygen Phases Segregated by Annealing Cz Silicon in the 600-800°C Range

Authors: Eugene B. Yakimov, Olga V. Feklisova, Maurizio Acciarri, Anna Cavallini, Sergio Pizzini

327

Electrical Characterization of As-Grown and Thermally Treated 8'' Silicon Wafers

Authors: Antonio Castaldini, Daniela Cavalcoli, Anna Cavallini, Sergio Pizzini, E. Susi

143

Electrical Properties of Oxygen Precipitates Formed During Two Step Low Temperature Annealing

Authors: Eugene B. Yakimov, Olga V. Feklisova, Maurizio Acciarri, Anna Cavallini, Sergio Pizzini