Articles by author: Antonio Castaldini
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Erbium in Silicon: Problems and Challenges
Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p197) -
Investigation of Stacking Faults in Silicon by Induced Current Methods
Published in: Defects in Semiconductors 15 (p1295) -
Investigation on Electrical Contacts on N-Type Silicon
Published in: Gettering and Defect Engineering in Semiconductor Technology (p529) -
n+/p Diodes Realized in SiC by Phosphorus Ion Implantation: Electrical Characterization as a Function of Temperature
Published in: Silicon Carbide and Related Materials 2004 (p649) -
Optical Properties of Oxygen Agglomerates in Silicon
Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p75) -
Recombination Properties of Defects in Gallium Nitride
Published in: Beam Injection Assessment of Microstructures in Semiconductors (p95) -
Silicon Carbide for Alpha, Beta, Ion and Soft X-Ray High Performance Detectors
Published in: Silicon Carbide and Related Materials 2004 (p1015) -
Solidification Simulation of Equiaxed Grains in Al - Si Eutectic Alloys
Published in: Aluminium Alloys - ICAA5 (p347)