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Papers by Author: Takaya Suzuki

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Electrical Properties of pn Diodes on 4H-SiC(000-1) C-Face and (11-20) Face

Authors: Yasunori Tanaka, Kazutoshi Kojima, Takaya Suzuki, T. Hayashi, Kenji Fukuda, Tsutomu Yatsuo, Kazuo Arai

1065

Fabrication of Mesa-Type pn Diodes without Forward Degradation on Ultra-High-Quality 6H-SiC Substrate

Authors: Yasunori Tanaka, Takaya Ohno, Naoki Oyanagi, Shin Ichi Nishizawa, Takaya Suzuki, Kenji Fukuda, Tsutomu Yatsuo, Kazuo Arai

1009

Impact Ionization Coefficients of 4H-SiC

Authors: Tetsuo Hatakeyama, Takatoshi Watanabe, Kazutoshi Kojima, Nobuyuki Sano, K. Shiraishi, Mitsuhiro Kushibe, Seiji Imai, Takashi Shinohe, Takaya Suzuki, Tomoyuki Tanaka, Kazuo Arai

673

4H-SiC MOSFETs on C(000-,1) Face with Inversion Channel Mobility of 127cm²/Vs

Authors: Kenji Fukuda, Makoto Kato, Junji Senzaki, Kazutoshi Kojima, Takaya Suzuki

1417

In-Situ Monitoring of AlN Crystal Growth on 6H-SiC by the Use of a Pyrometer

Authors: Takaya Suzuki, T. Inushima

1565

Influence of Stacking Faults on the I-V Characteristics of 4H-SiC Schottky Barrier Diodes Fabricated on the (11-20) Face

Authors: Kazutoshi Kojima, Takaya Ohno, Tatsuo Fujimoto, Masakazu Katsuno, Noboru Ohtani, Johji Nishio, Yuuki Ishida, Tetsuo Takahashi, Takaya Suzuki, Tomoyuki Tanaka, Kazuo Arai

925

Effective Normal Field Dependence of Inversion Channel Mobility in 4H-SiC MOSFETs on the (11-20) Face

Authors: Junji Senzaki, Kazutoshi Kojima, Takaya Suzuki, Kenji Fukuda

613

High Inversion Channel Mobility of MOSFET Fabricated on 4H-SiC C(000-1) Face Using H₂ Post-Oxidation Annealing

Authors: Kenji Fukuda, Junji Senzaki, Kazutoshi Kojima, Takaya Suzuki

567

Measurement of Hall Mobility in 4H-SiC for Improvement of the Accuracy of the Mobility Model in Device Simulation

Authors: Tetsuo Hatakeyama, Takatoshi Watanabe, Mitsuhiro Kushibe, Kazutoshi Kojima, Seiji Imai, Takaya Suzuki, Takashi Shinohe, Tomoyuki Tanaka, Kazuo Arai

443

Significant Improvement of Inversion Channel Mobility in 4H-SiC MOSFET on (11-20) Face Using Hydrogen Post-Oxidation Annealing

Authors: Junji Senzaki, Kenji Fukuda, Kazutoshi Kojima, Shinsuke Harada, Ryouji Kosugi, Seiji Suzuki, Takaya Suzuki, Kazuo Arai

1061