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The Measurements of Spectral Reflectance Spatial Distribution on Mc-Si Solar Cell Surface

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Abstract:

Measurement results of spectral reflectance spatial distribution on multi-crystalline silicon solar cells surface are presented. The optical measurement apparatus employs a specific designed micro-spectral reflectance meter. It is suitable for working in visible wavelength range; measurable sample size can be as small as 0.06mm. Results of reflectance distribution on mc-Si solar cell are presented as a spatial sampling interval of 0.1 mm. The peak values of spectral reflectance appear about 400nm wavelength and vary from 10% to 30% with the spatial position on solar cell.

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Periodical:

Applied Mechanics and Materials (Volumes 241-244)

Pages:

2184-2187

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.241-244.2184

Citation:

Cite this paper

Online since:

December 2012

Authors:

Xiao Dong Zheng, Yan Zhong Ye, Lin Fang Shen

Keywords:

Mc-Silicon, Measurement, Solar Cell, Spatial Distribution, Spectral Reflectance

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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References

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