Framework of RFID-Based Infrastructure Project Quality Management Expert System

Abstract:

This paper presents a real time information tracing and monitoring expert system for the infrastructure project quality management with radio frequency identification (RFID) technology. This paper purposes to research the improvement of the real time information tracing method and the quality management in the infrastructure project. The paper studies and analyzes the advantages and issues of RFID technology and structures a RFID tracing system. Based on a value-focus-process (VFP) model of the project, a quality expert management system is built with the composition of RFID systems, VFP expert system and project management system. The VFP expert system inspects project quality by tracing the activities of the materials and members objectives in the project, and analyzes the information to determine the causes of abnormal and how to guarantee the quality. The VFP expert system also provides security schemes for the project to avoid risks. By utilizing RFID tracing technology, the project management system may be more effectively and sensitive with accidents than the traditional one. The paper finds that the quality management workflow in infrastructure project can be more visible and controllable with an RFID-based VFP expert system.

• Periodical: Applied Mechanics and Materials (Volume 39)
• Pages: 352-358
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.39.352
• Online since: November 2010
• Authors: Hai Fang Cheng, Dan Feng Zou, Shi Miao Jiang
• Keywords: Quality Management, Radio Frequency Identification (RFID), Value-Focus-Process Model

References

[1] S. Y. Christina, and S. Danny: International Journal of Operations & Production Management Vol. 29(2009), p.612.

[2] T. F. Gattiker, and C. R. Carter: Journal of Operations Management Vol. 28(2010), p.72.

[3] F. Geraldo, D. Nicholas, and A. Uday: International Journal of Production Economics Vol. 124(2010), p.414.

[4] L. Jr. Jung, S. Y. Chang, and T. L. Chen: Expert Systems with Applications Vol. 36(2009), p.10877.

[5] C. C. Chao, J. M. Yang, and W. Y. Jen: Technovation Vol. 27(2007), p.268.

[6] B.S. Vijayaraman, and B. A. Osyk: The International Journal of Logistics Management Vol. 17(2006), p.6.

[7] P. Vrba, F. Macurek, and V. Marik: Engineering Applications of Artificial Intelligence Vol. 21(2008), p.331.

[8] A. D. Smith: Information Management & Computer Security Vol. 13(2005), pp.16-28.

[9] D. Neiger, K. Rotaru, and L. Churilov: Journal of Operations Management Vol. 27(2009), p.154.