Method for CCD Edge Signal Processing

Guo Sheng Xu

doi:10.4028/www.scientific.net/AMM.441.695

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 441Method for CCD Edge Signal Processing

Method for CCD Edge Signal Processing

Abstract:

In order to improve the measuring precision of the one-dimension line-matrix CCD, a new sub-pixel edge detection method is proposed. Firstly the date collected by the line-matrix CCD is converted to digital data by virtual oscillograph. Base on threshold comparison, the fitting part of the edge signal is picked up for further processing; secondly, the pixels are expanded following the edge direction of the edge point, and the edge signal is fitted through the two order multinomial; finally, comparing the two order curve with the threshold voltage through the least square fit method, the precise position of the edge point can achieve the sub-pixel edge location precision.

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Periodical:

Applied Mechanics and Materials (Volume 441)

Pages:

695-698

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.441.695

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Online since:

December 2013

Authors:

Guo Sheng Xu

Keywords:

CCD, Edge Detection, Image Processing

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