Spectroscopic and Morphological Investigation of Copper-Containing Nanocomposites

V.A. Shmatko; T.N. Myasoedova; G.E. Yalovega

doi:10.4028/www.scientific.net/AMR.1091.15

Paper Titles

Preface and Committee

A Capacitive Ammonia Sensor Using the Commercial 0.18 μm CMOS Process
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Phosphorous Incorporated-Silicon Nanoparticles Synthesized Using Double Tube Reactor and Inductive Coupled Plasma
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Spectroscopic and Morphological Investigation of Copper-Containing Nanocomposites
p.15

Crystallite Cluster Structure Formation Resulting from Semi-Enclosed Cage Interaction in TSI-POSS/PU Hybrid Composites
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Adsorption of Sulfur’s Atoms on the Outer Surface of Carbon Nanotubes
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Terbium Complex Triboluminophore for Optical Sensorics
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3-py-TTF: Efficient and Simple Colorimetric Sensor for Copper Ion in Aqueous Solutions
p.35

Research on SOFC of Composite Anode Material SrMoO₃-YSZ Impregnated with Gd_0.2Ce_0.8O_1.9 by Hard Template Method
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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 1091Spectroscopic and Morphological Investigation of...

Spectroscopic and Morphological Investigation of Copper-Containing Nanocomposites

Abstract:

In the paper the SiO₂CuO_x and SiO₂(CuO_xSnO_y) thin films were deposited from the alcoholic solutions employing the sol-gel technique. The films were characterized by means of SEM (scanning electron microscopy) and 2p x-ray photoelectron spectroscopy (XPS). The SEM studies found the grain shape changes from flower-like to regular shaped inorganic agglomerates as result of adding the SnCl₄ into the sol. The X-ray photoelectron spectroscopy (XPS) studies showed the presence both CuO and CuO₂phases and formation of a double CuSiO₃oxide phase.

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Periodical:

Advanced Materials Research (Volume 1091)

Pages:

15-18

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1091.15

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Online since:

February 2015

Authors:

V.A. Shmatko*, T.N. Myasoedova, G.E. Yalovega

Keywords:

Adsorption Centers, Cu/Sn Mixed Oxide, Cupric Oxide, Electronic Structure, Surface Morphology, Thin Films

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References

[1] H.G. Yu, J.G. Yu, S.W. Liu, S. Mann: Chemistry of Materials Vol. 19 (2007), p.4327–34.

Google Scholar

[2] J. Jiang, Y.Y. Li, J.P. Liu, X.T. Huang, C.Z. Yuan, X.W. Lou: Advanced Materials Vol. 24 (2012), p.5166–80.

Google Scholar

[3] T.N. Myasoedova, G.E. Yalovega, V.V. Petrov, O.V. Zabluda, V.A. Shmatko, A.O. Funik Properties of SiO 2 CuO x Films for Nitrogen Dioxide Detection /Advanced Materials Research Vols. 834-836 (2014), pp.12-116.

DOI: 10.4028/www.scientific.net/amr.834-836.112

Google Scholar

[4] M. Kwoka, L. Ottaviano, M. Passacantando, S. Santucci, G. Czempik, J. Szuber: Thin Solid Films Vol. 490 (2005), p.36 – 42.

DOI: 10.1016/j.tsf.2005.04.014

Google Scholar

[5] Jae Cheon Sohn, Sung Eun Kim, Zee Won Kim, and Yun Sik Yu: Transactions on electrical and electronic materials Vol. 10, N. 4 (2009).

Google Scholar

[6] B. Liu, H.C. Zeng: J. Am. Chem. Soc. Vol. 126 (2004), p.8124.

Google Scholar

[7] X.M. Lin, A.C.S. Samia: J. Magn. Magn. Mater Vol. 305 (2006), p.100.

Google Scholar

[8] M. Vaseem, A. Umar a, Y.B. Hahn, D.H. Kim, K.S. Lee, J.S. Jang, J.S. Lee: Catalysis Communications Vol. 10 (2008), p.11–16.

DOI: 10.1016/j.catcom.2008.07.022

Google Scholar

[9] J. Y. Ho, M. H. Huang:J. Phys. Chem. C Vol. 10 (2009), p.1021.

Google Scholar

[10] N.K. Plugotarenco, A.N. Korolev, V.V. Petrov, T.N. Nazarova: Inorganic Materials Vol. 43 (2007), pp.1010-1014.

Google Scholar

[11] Information on http: /www. ntmdt. com.

Google Scholar

[12] Sung-Sik Chang, Hyung-Jik Lee, Hye Jeong Park: Ceramics International Vol. 31,I. 3 (2005), pp.411-415.

Google Scholar

[13] J. Morales, A. Caballero, J. P. Holgado, J. P. Espinós, A. R. González-Elipe: J. Phys. Chem. B Vol. 106 (2002), p.10185.

Google Scholar

[14] C. D. Wanger, W. M. Riggs, L. E. Davis, J. F. Moulder and G. E. Muilenberg. Handbook of X-ray Photoelectron Spectroscopy (Perkin-Elmer Corp., Physical Electronics Division, USA 1979).

DOI: 10.1002/sia.740030412

Google Scholar

[15] N. S. McIntyre, S. Sunder, D. W. Shoesmith, F. W. Stanchell: J. Vac. Sci. Technol Vol. 18, N. 3 (1981), p.714—721.

Google Scholar