Temperature Dependent Current-Voltage Characteristics of n-Type β-FeSi2/Intrinsic Si/p-Type Si Heterojunctions

Article Preview

Abstract:

In this work, n-type β-FeSi2/intrinsic Si/p-type Si heterojunctions were prepared by facing-targets direct-current sputtering. We measured their current-voltage characteristics at low temperatures ranging from 300 K down to 50 K and investigated their ideality factor, saturation current and series resistance using thermionic emission theory and Cheung’s method. From thermionic emission theory, the ideality factor and saturation current density were calculated from the slope of the linear part from the forward lnJ-V and the straight line intercept of lnJ-V at zero voltage, respectively. When the temperature decreased from 300 K down to 50 K, the ideality factor increased from 1.12 to 11.13, whereas the saturation current density decreased from 2.09 × 10-6 A/cm2 to 1.06 × 10-9 A/cm2. Using Cheung’s method, we plotted the relations of dV/d(lnJ)-J and H(J)-J in order to estimate the series resistance from the slope of both plots. In addition, we estimated the ideality factor from a y-axis intercept of the dV/d(lnJ)-J plot. The series resistances from both plots were consistent with each other and increased with the decreasing temperature. The ideality factor estimated by Cheung’s method was in agreement with that obtained from estimation by thermionic emission theory.

You might also be interested in these eBooks

Info:

Periodical:

Advanced Materials Research (Volumes 1120-1121)

Pages:

435-439

Citation:

Online since:

July 2015

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2015 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] M. Shaban, K. Nomoto, S. Izumi, and T. Yoshitake, n-Type β-FeSi2/intrinsic-Si/p-type Si heterojunction photodiodes for near-infrared light detection at room temperature, Appl. Phys. Lett. 95 (2009) 162102-1 - 162102-3.

DOI: 10.1063/1.3250171

Google Scholar

[2] N. Promros, K. Yamashita, S. Izumi, R. Iwasaki, M. Shaban and T. Yoshitake, Near-Infrared Photodetection of n-Type β-FeSi2/Intrinsic Si/p-Type Si Heterojunctions at Low Temperatures, Jpn. J. Appl. Phys. 51 (2012) 09MF02-1 - 09MF02-4.

DOI: 10.7567/jjap.51.09mf02

Google Scholar

[3] N. Promros, K. Yamashita, R. Iwasaki, and T. Yoshitake, Effects of Hydrogen Passivation on Near-Infrared Photodetection of n-Type β-FeSi2/p-Type Si Heterojunction Photodiodes, Jpn. J. Appl. Phys. 51 (2012) 108006-1 - 108006-2.

DOI: 10.7567/jjap.51.108006

Google Scholar

[4] T. Yoshitake, Y. Inokuchi, A. Yuri, and K. Nagayama, Direct epitaxial growth of semiconducting β-FeSi2 thin films on Si(111) by facing targets direct-current sputtering, Appl. Phys. Lett. 88 (2006) 182104-1 - 182104-3.

DOI: 10.1063/1.2200153

Google Scholar

[5] F. Ozyurt Kus, T. Serin, and N. Serin, Current transport mechanisms of n-ZnO/p-CuO heterojunctions, J. Optoelectron. Adv. M. 11 (2013) 1855 - 1859.

Google Scholar

[6] H. S. Hafez, I. S. Yahia, G. B. Sakr, M. S. A. Abdel-Mottaleb, and F. Yakuphanoglu, Extraction of the DSSC parameters based TiO2 under dark and illumination conditions, Adv. Mater. Corros. 1 (2012) 8 - 13.

Google Scholar

[7] A. A. M. Farag, I. S. Yahia, T. Wojtowicz, and G. Karczewski, Influence of temperature and illumination on the electrical properties of p-ZnTe/n-CdTe heterojunction grown by molecular beam epitaxy, J. Phys. D: Appl. Phys. 43 (2010).

DOI: 10.1088/0022-3727/43/21/215102

Google Scholar

[8] D. Song, and B. Guo, Electrical properties and carrier transport mechanisms of n-ZnO/SiOx/n-Si isotype heterojunctions with native or thermal oxide interlayers, J. Phys. D: Appl. Phys. 42 (2009) 025103-1 - 025103-8.

DOI: 10.1088/0022-3727/42/2/025103

Google Scholar

[9] A. M. Rodrigues, Extraction of Schottky diode parameters from current-voltage data for a chemical-vapor-deposited diamond/silicon structure over a wide temperature range, J. Appl. Phys. 103 (2008) 083708-1 - 083708-6.

DOI: 10.1063/1.2908858

Google Scholar