Effect of Network-Forming Oxides on Long-Lasting Phosphorescencein Mn2+ Doped ZnO-B2O3-SiO2 Glass

Feng Feng Li; Ming Xi Zhang; Yi Shen; Qing Hui Wang; Zhi Gang Liu

doi:10.4028/www.scientific.net/AMR.156-157.759

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 156-157Effect of Network-Forming Oxides on Long-Lasting...

Effect of Network-Forming Oxides on Long-Lasting Phosphorescencein Mn²⁺Doped ZnO-B₂O₃-SiO₂ Glass

Abstract:

Mn2+-doped zinc borosilicate glasses (ZSBM) with excellent long-lasting phosphore- scence (RTSLLP) and photostimulated long-lasting phosphorescence (PSLLP) were successfully synthesissed by high tempreture solid-state reaction. Through increasing the ratio of SiO2/ B2O3 with fixing the content of ZnO in 60mol%, RTSLLP and PSLLP were improved obviously. By TL study, it was seen that the traps concentration had a big change with the increasing in silica content, which bringed a positive impact on the RTSLLP and PSLLP, especially PSLLP performance, and through infrared absorption spectrum analysis, it was confirmed that the distribution of trap-level was closely related to the silicon oxygen groups and boron oxygen groups.

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Advanced Manufacturing Technology, ICAMMP 2010

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Periodical:

Advanced Materials Research (Volumes 156-157)

Pages:

759-765

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.156-157.759

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Online since:

October 2010

Authors:

Feng Feng Li, Ming Xi Zhang, Yi Shen, Qing Hui Wang, Zhi Gang Liu

Keywords:

Glass, Long-Lasting Phosphorescence, Silicon Boron Ratio, Structural Group, Trap

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