Microstructure and Damping Property of the Composite Discontinuous NiTi SMA Thin Films Deposited on PZT Substrate

Abstract:

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Discontinuous NiTi SMA thin films were deposited on PZT substrate by magnetron sputtering method with a specially designed pore plate. The microstructure and damping property of the prepared composite were studied with X-Ray diffraction, scanning electric microscopy and dynamic elastic modulus apparatus. It was found that the NiTi SMA thin films with physical dimension of the width of less-than or equal to 2mm and distance between the adjacent thin films of 1mm are of best equiaxed crystal structure after crystallization at 600°C. The damping effect of the composite is still caused by PZT and the damping value is generally lower than that of pure PZT, about 9.9%.

Info:

Periodical:

Advanced Materials Research (Volumes 295-297)

Edited by:

Pengcheng Wang, Liqun Ai, Yungang Li, Xiaoming Sang and Jinglong Bu

Pages:

1951-1957

DOI:

10.4028/www.scientific.net/AMR.295-297.1951

Citation:

Q. S. Liu et al., "Microstructure and Damping Property of the Composite Discontinuous NiTi SMA Thin Films Deposited on PZT Substrate", Advanced Materials Research, Vols. 295-297, pp. 1951-1957, 2011

Online since:

July 2011

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$35.00

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