Optical Reﬂection from a Monolayer of Embedded Nano-Objects Covered by a Thick Capping Layer

C.M.J. Wijers; O. Voskoboynikov

doi:10.4028/www.scientific.net/AMR.31.52

Paper Titles

Sputtered SiO₂ Induced Atomic Interdiffusion in Semiconductor Nano Heterostructures
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DFB Lasers with Tilted Waveguide for Multi-Wavelength Generation
p.36

Enhanced UV Photodetector Responsivity in Porous GaN/Si(111) by Metal-Assisted Electroless Etching
p.39

Growth, Surface Morphology and Optical Properties of Gallium Nitride Nanowires
p.42

Optical Reﬂection from a Monolayer of Embedded Nano-Objects Covered by a Thick Capping Layer
p.52

Visible Light Emission from Ordered Nanopatterned InP Surface
p.56

Dependence of the Absorption Spectra of III-V Semiconductor Quantum Dots on the Size Distribution
p.59

Conspicuous Presence of Higher Order Transitions in the Photoluminescence of In_xGa_1-xN/GaN Quantum Wells
p.62

The Study of Femto-Second Laser Induced Damage Threshold on Semi-Insulating GaAs Wafer
p.65

HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 31Optical Reﬂection from a Monolayer of Embedded...

Optical Reﬂection from a Monolayer of Embedded Nano-Objects Covered by a Thick Capping Layer

Abstract:

In a hybrid discrete-continuum description the optical response of a capped monolayer of nano-objects has been determined. The monolayer emits a summation of partial plane waves obeying traditional reflection and transmission, enabling solution of the monolayer dipole strength. For thick capping layers the resulting reflection coefficients could be approximated by analytical expressions. These results have been used to investigate the feasibility of experimental detection of the optical response of nano-object monolayers.