Suitable Characterization Methods and Insulating Materials for Devices Operating above 200 °C

Marie Laure Locatelli; Sombel Diaham; Zarel Valdez-Nava; Mireille Bechara; Rabih Khazaka

doi:10.4028/www.scientific.net/AMR.324.229

Paper Titles

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Investigation of Thermo-Oxidative Polyimide Thin Film Aging at High Temperature
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Suitable Characterization Methods and Insulating Materials for Devices Operating above 200 °C
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Electrical and Optical Properties of Indium-Modified SeSbTe Thin Films for Low Power Memory Devices
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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 324Suitable Characterization Methods and Insulating...

Suitable Characterization Methods and Insulating Materials for Devices Operating above 200 °C

Abstract:

Two characterization techniques, the steady-state Conduction Current (CC) and the low frequency Dielectric Spectroscopy (DS) are reviewed and compared to each other in order to choose the most suitable method for evaluating the static electrical conductivity (σDC) of an insulating material. In the case of polymeric materials operating above 200°C, the DS appears as being better suited. These techniques are applied for insulating materials identified as good candidates for high temperature (HT) applications and new results are presented. HT polyimide, parylene films and silicon nitride substrates are studied. These examples highlight the σDC magnitudes for temperatures up to 400 °C, as well as other relevant parameters to be taken into account for practical applications.

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Periodical:

Advanced Materials Research (Volume 324)

Pages:

229-232

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.324.229

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Online since:

August 2011

Authors:

Marie Laure Locatelli, Sombel Diaham, Zarel Valdez-Nava, Mireille Bechara, Rabih Khazaka

Keywords:

BPDA-PDA, Conduction Current, Dielectric Materials, Dielectric Spectroscopy, Electrical Conductivity, High-Temperature, Parylene F, Polyimide, Silicon Nitride

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