Defect Interactions and Polytype Transitions

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Abstract:

The polytype transitions are caused by disorder generation in the initial structure due to energy dissipation. The disorder is strongly related to the formation and propagation of stacking faults and partial dislocations. Collective and selective interactions between these defects result in a stability loss of the original structure leading to nonequilibrium phase transition occur if the critical point is reached. The stability of the defect subsystem was investigated in the stationary state for three types of stacking faults. The combination of the stability analysis with the defect generation processes during the different technological and devices operation processes allows predicting the critical values for the external forces and fluxes leading to phase transitions.

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217-220

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August 2011

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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[1] R.J. Angel: Z. Kristallogr. Vol. 176 (1986), p.193.

Google Scholar

[2] A.A. Kalnin, V.V. Lutschinin, F. Neubert and Yu.M. Tairov: Sov. Phys. Tech. Phys. Vol. 29 (1984), p.807.

Google Scholar

[3] A.A. Kalnin, F. Neubert and J. Pezoldt: Diamond Rel. Mater. Vol. 3 (1994), p.346.

Google Scholar

[4] Y. M- Tairov and V.F. Tsvetkov: Progr. Cryst. Growth Charact. Vol. 7 (1983), p.111.

Google Scholar

[5] A.A. Kalnin, J. Pezoldt and Yu.M. Tairov: Sov. Phys. Solid State Vol. 29 (1987), p.328.

Google Scholar

[6] J. Pezoldt: Mater. Sci. Eng. B Vol 29 (1995), p.99.

Google Scholar

[7] J. Pezoldt, A.A. Kalnin, D.R. Moskwina and W.D. Savelyev: Nucl. Instr. Meth. Phys. Res. B Vol. 80-81 (1993), p.943.

Google Scholar

[8] J. Pezoldt, B. Stottko, G. Kupris and G. Ecke: Mater. Sci. Eng. B Vol. 29 (1995), p.94.

Google Scholar

[9] R.S. Okojie, M. Xhang, P. Pirouz, S. Tumakha, G. Jessen and L.J. Brillson: Apll. Phys. Lett. Vol. 79 (2001), p.3056.

DOI: 10.1063/1.1415347

Google Scholar

[10] S. Tumakha, L.J. Brillson, G.H. Jessen, R.S. Okojie, D. Lukco, M. Zhang and P. Pirouz, J. Vac. Sci. Technol. B Vol. 20 (2002), p.554.

DOI: 10.1116/1.1451303

Google Scholar

[11] A.O. Konstantinov and H. Bleicher: Appl. Phys. Lett. Vol. 71 (1997), p.3700.

Google Scholar

[12] P. Pirouz and J.W. Yang: Ultramicroscopy Vol. 51 (1993), p.189.

Google Scholar