Ultrafast Electrical Signal Electro-Optic Sampling Test Theory and Test System

Jian Wei Li; Nan Xu; Jian Li; Zhi Xin Zhang

doi:10.4028/www.scientific.net/AMR.571.471

Paper Titles

Methods of Determining Optimal Fitting Spherical Surface for Off-Axis Aspheric Optics Finishing
p.450

Wavelength Division Multiplexing between 2.5-Gbits/s Chaotic Optical Secure Channel and 10-Gbits/s Nonchaotic Fiber-Optic Channel
p.457

The Design and Experimental Study of the Laser with Peak Power
p.462

Laser Linewidth Measurements Using Self-Heterodyne Detection with Total-Reflected Delay Line
p.467

Ultrafast Electrical Signal Electro-Optic Sampling Test Theory and Test System
p.471

Optical-Mode Study of Galium Nitrate Based Laser Diodes
p.476

Research of Optical Fiber Degree of Polarization (DOP) Measurement
p.482

An Improved CSO Resolution Method for IR Sensor Based on Pixel-Cluster Decomposition
p.486

Experimental Investigation of Terahertz Temporal Response of a Photoconductive Switch
p.491

HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 571Ultrafast Electrical Signal Electro-Optic Sampling...

Ultrafast Electrical Signal Electro-Optic Sampling Test Theory and Test System

Abstract:

Discussed the principle of electro-optic sampling technique and implementation methods of Ultra-fast electrical signals, the electric field of electro-optical crystal and sampling pulses as well as the interaction between the principle of time scanning unit, established the coplanar waveguide parameters model, and analyzed the technical indicators of test system.

You might also be interested in these eBooks

Opto-Electronics Engineering and Materials Research

View Preview

Info:

Periodical:

Advanced Materials Research (Volume 571)

Pages:

471-475

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.571.471

Citation:

Cite this paper

Online since:

September 2012

Authors:

Jian Wei Li, Nan Xu, Jian Li, Zhi Xin Zhang

Keywords:

Coplanar Waveguide, Electro-Optic Sampling, Equivalent Time Sampling, High-Speed Photodetector

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] Bieler M, Spitzer M, Hein G. Characterization of a microwave probe up to frequencies of 400GHz . IEEE MTT-S Digest [C], 2003, 3: 1811~1814.

DOI: 10.1109/mwsym.2003.1210492

Google Scholar

[2] Bieler M, Spitzer M, Hein G. Ultrafast optics establishes metrological standards in high-frequency electronics . Appl. Phys. (A), 2004, 78(4): 429~433.

DOI: 10.1007/s00339-003-2399-7

Google Scholar

[3] Seitz S, Bieler M, Hein G, et al. Correction of picosecond voltage pulses measured with external electro-optic sampling tips. IOP Meas. Sci. Technol, 2007, 18: 1353~1360.

DOI: 10.1088/0957-0233/18/5/023

Google Scholar

[4] Williams D F, Hale P D, Clement T S, et al. Calibrated 200-GHz waveform measuremen. IEEE Trans on MTT, 2005, 53(4): 1384~1389.

DOI: 10.1109/tmtt.2005.845760

Google Scholar

[5] Williams D F, Hale P D, Clement T S. Mismatch correction for electro-optic sampling system. Proc 56th ARFTG Conference Digest. 2000, 38: 1~5.

DOI: 10.1109/arftg.2000.327447

Google Scholar

[6] Bieler M, Seitz S, Spitzer M. Rise-time calibration of 50-GHz sampling oscilloscopes: intercomparison between PTB and NPL. IEEE Trans on MIT, 2007, 56(2): 266~270.

DOI: 10.1109/tim.2007.890609

Google Scholar

[7] Brian H. Kolner, David M. Bloom. Electrooptic sampling in GAAs integrated circuits . IEEE, 1986, 22(1): 79~93.

DOI: 10.1109/jqe.1986.1072877

Google Scholar

[8] Lu Wang, Qinggang Liu, Suoyin Li etc. Ultra -high speed Electro-optic Sampling Technology and Application. Micro scope, Measurement, Microfabrication & Equipment, 2006, 4: 197~202.

Google Scholar

[9] Yanhui Wang, Maobin Yi, Wei Sun, Study on Semiconductor laser electro-optic sampling Measurement Technology. Journal of Dalian University of Technology, 1998, 38(5): 521~524.

Google Scholar