Laser Linewidth Measurements Using Self-Heterodyne Detection with Total-Reflected Delay Line

Article Preview

Abstract:

As an important parameter in the laser communication system, the narrow linewidth of tunable laser source (TLS) must be measured accurately. Therefore, the linewidth of a TLS was measured with the delayed self-heterodyne detection method in the present work. The total-reflected delay line was used in the measurement system for make full use of 25km single-mode fiber delay line. The measured linewidth of the 1550 TLS is of 127 kHz, in agreement with the nominal value.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

467-470

Citation:

Online since:

September 2012

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Continuously Wavelength-Tunable Laser Source Using a Self-Injected Fabry–Pérot Laser Diode, IEEE Photonics Technology Letters ; 1041-1135 ; 2011 ; vol. 23 ; no. 6 ; pp.332-334.

DOI: 10.1109/lpt.2010.2103934

Google Scholar

[2] Broadly Tunable Laser Using Double-Rings Vertically Coupled to a Passive Waveguide, Kapsalis, A.; Syvridis, D.; Hamacher, M.; Heidrich, H.; IEEE Journal of Quantum Electronics ; 0018-9197 ; 2010 ; vol. 46 ; no. 3 ; pp.306-312.

DOI: 10.1109/jqe.2009.2033714

Google Scholar

[3] TUNABLE LASER SOURCE, Bernard-Alexandre Gaulin; Sensor technology ; 8756-4017 ; 2010 ; vol. 26 ; no. 7 ; p.9.

Google Scholar

[4] Simultaneous Measurements for Tunable Laser Source Linewidth with Homodyne Detection, Adnan H. Ali; Computer and information science ; 1913-8997 ; 2011 ; vol. 4 ; no. 4 ; pp.138-144.

DOI: 10.5539/cis.v4n4p138

Google Scholar

[5] L.B. Mercer. 1/f frequency noise effects on self-heterodyne linewidth measurements. IEEE Journal of Lightwave Technology, 9(4): 485–493, (1991).

DOI: 10.1109/50.76663

Google Scholar

[6] Philippe B. Gallion and Guy Debarge. Quantum phase noise and field correlation in single frequency semiconductor laser systems. IEEE Journal of Quantum Electronics, QE20(4): 343–349, (1984).

DOI: 10.1109/jqe.1984.1072399

Google Scholar