Effect of Annealing Temperature on Structural and Electrical Properties of Bismuth Ferrite Thin Film

Min Fang Zhang; Jing Song Liu

doi:10.4028/www.scientific.net/AMR.602-604.1474

Paper Titles

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 602-604Effect of Annealing Temperature on Structural and...

Effect of Annealing Temperature on Structural and Electrical Properties of Bismuth Ferrite Thin Film

Abstract:

The BiFeO3 thin film was prepared by sol-gel process on Pt/Si substrates. The dependences of structural, electrical properties on annealed temperature were studied. X-ray diffraction (XRD) analysis revealed that the pure phase of BiFeO3 thin film was obtained when annealed below 650°C for 60 minutes in air. The film annealed at lower temperature had denser surface morphology, and showed better electrical characteristic.

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Periodical:

Advanced Materials Research (Volumes 602-604)

Pages:

1474-1478

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.602-604.1474

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Online since:

December 2012

Authors:

Min Fang Zhang, Jing Song Liu

Keywords:

Bismuth Ferrite, Electrical Properties, Sol-Gel (SG)

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