Flow Characteristics for High-Speed Scanning in Immersion Lithography

Article Preview

Abstract:

High-speed scanning is an effective way to improve the throughput of immersion lithography with double patterning, especially when the critical dimension is less than 32-nm. But it makes more complex characteristics of immersion flow. In this paper, considering the extreme speed of wafer scanning, the model is developed to investigate the characteristics of immersion flow, including the velocity vector, pressure distribution, renovation efficiency and so on. Finally, the optimized parameters and methods to effective liquid renovation are proposed when the wafer scans at high-speed.

You might also be interested in these eBooks

Info:

Periodical:

Advanced Materials Research (Volumes 622-623)

Pages:

869-872

Citation:

Online since:

December 2012

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2013 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] H. Yaegshi, K. Oyama and K. Yabe: J. Photopolym Sci. Technol. Vol. 24 (2011), p.491.

Google Scholar

[2] K. G. Arun, G. Evangelos and E. Fabrizio: Microfluid Nanofluid, Vol. 10 (2011), p.1351.

Google Scholar

[3] M. Sogard and M. Park, U.S. Patent 11, 450, 381. (2007).

Google Scholar

[4] J. Fay: Introduction to Fluid Mechanics (Cambridge University Press, Britain 2000).

Google Scholar

[5] Y. Matsui, N. Onoda and S. Nagahara: IEEE Trans Semicond, Vol. 22 (2009), p.438.

Google Scholar

[6] A. C. Wei, G. F. Nellis and A. Y. Abodo: J. Microlith., Microfab., Microsyst., Vol. 3 (2004), p.28.

Google Scholar