Stimulate and Eliminate Electronic Product Design Defects By Reliability Enhancement Testing

Hai Xin Peng; Rui Kang

doi:10.4028/www.scientific.net/AMR.663.621

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 663Stimulate and Eliminate Electronic Product Design...

Stimulate and Eliminate Electronic Product Design Defects By Reliability Enhancement Testing

Abstract:

This paper first introduces the test profile of Reliability Enhancement Testing(RET) then completed in the past three years, a large number of the implementation results of the RET test were statistically analyzed, given the distribution of the design defect, the last two design defects excitation and elimination process were be detailed explanation, and demonstrated it is exceptionally effective that the RET test inspire and eliminate electronic product design defects.

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Periodical:

Advanced Materials Research (Volume 663)

Pages:

621-625

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.663.621

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Online since:

February 2013

Authors:

Hai Xin Peng, Rui Kang

Keywords:

Design Defect, Reliability Enhancement Testing (RET), Test Profile

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References

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