Characterization of Magnetic Particles Using a Wavelet Function

Abstract:

The second derivative of the remission function of several magnetic materials is calculated for the parameterization of the position and intensity of the absorption bands of diffuse reflectance spectroscopy. The reflectance spectra are obtained by ultraviolet-visible spectroscopy (UV-VIS) from 400 to 1100 nm at increments of 1nm. The noise of the remission function results on errors after calculating the second derivative. Therefore, filtering of the remission function is needed before taking any action on this signal. Several methods are tested in order to calculate the second derivative. The best polynomial resulted on a second order wavelet function which is applied to the filtered remission function. Light scattering Mie theory is used to prove the behaviour of the reflected light. This research provides a method to identify and quantify magnetic particles, as well as the crystal size.

• Periodical: Advanced Materials Research (Volume 68)
• Pages: 175-182
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.68.175
• Online since: April 2009
• Authors: Humberto J. Ochoa Domínguez, Perla E. Garcia Casillas, Carlos A. Martínez Pérez, José Trinidad Elizalde Galindo, Hector Camacho Montes, Osslan O. Vergara Villegas, Efren Gutiérrez Casas, Leticia Ortega Maynez
• Keywords: Cyclodextrin, Magnetic Nanoparticle, Mie Theory, Ultraviolet-Visible Spectroscopy, Wavelet Function

References

This article has no references.