Characterization of Magnetic Particles Using a Wavelet Function

Abstract:

Article Preview

The second derivative of the remission function of several magnetic materials is calculated for the parameterization of the position and intensity of the absorption bands of diffuse reflectance spectroscopy. The reflectance spectra are obtained by ultraviolet-visible spectroscopy (UV-VIS) from 400 to 1100 nm at increments of 1nm. The noise of the remission function results on errors after calculating the second derivative. Therefore, filtering of the remission function is needed before taking any action on this signal. Several methods are tested in order to calculate the second derivative. The best polynomial resulted on a second order wavelet function which is applied to the filtered remission function. Light scattering Mie theory is used to prove the behaviour of the reflected light. This research provides a method to identify and quantify magnetic particles, as well as the crystal size.

Info:

Periodical:

Edited by:

S. Velumani and René Asomoza

Pages:

175-182

DOI:

10.4028/www.scientific.net/AMR.68.175

Citation:

H. J. Ochoa Domínguez et al., "Characterization of Magnetic Particles Using a Wavelet Function", Advanced Materials Research, Vol. 68, pp. 175-182, 2009

Online since:

April 2009

Export:

Price:

$35.00

In order to see related information, you need to Login.