Characterization of Magnetic Particles Using a Wavelet Function
The second derivative of the remission function of several magnetic materials is calculated for the parameterization of the position and intensity of the absorption bands of diffuse reflectance spectroscopy. The reflectance spectra are obtained by ultraviolet-visible spectroscopy (UV-VIS) from 400 to 1100 nm at increments of 1nm. The noise of the remission function results on errors after calculating the second derivative. Therefore, filtering of the remission function is needed before taking any action on this signal. Several methods are tested in order to calculate the second derivative. The best polynomial resulted on a second order wavelet function which is applied to the filtered remission function. Light scattering Mie theory is used to prove the behaviour of the reflected light. This research provides a method to identify and quantify magnetic particles, as well as the crystal size.
S. Velumani and René Asomoza
H. J. Ochoa Domínguez et al., "Characterization of Magnetic Particles Using a Wavelet Function", Advanced Materials Research, Vol. 68, pp. 175-182, 2009