Characterization of Nanostructured ZnO Thin Films Deposited by Sol-Gel Spin Coating

Abstract:

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ZnO thin films have been deposited onto the glass substrates by the sol-gel spin coating method at different chuck rotation rates. The effect of deposition parameters on the structural, optical and electrical properties of the ZnO thin films was investigated. The crystal structure and orientation of the ZnO thin films were investigated by X-ray diffraction (XRD) patterns. The optical absorbance and transmittance measurements were recorded by using a double beam spectrophotometer. The optical absorption studies reveal that the transition is direct band gap energy. The I-V plots of the ZnO thin films were carried out in dark and under UV-illumination. The result shows the obtained ZnO thin films can be used as a photovoltaic material.

Info:

Periodical:

Advanced Materials Research (Volumes 79-82)

Edited by:

Yansheng Yin and Xin Wang

Pages:

703-706

DOI:

10.4028/www.scientific.net/AMR.79-82.703

Citation:

S. Y. Quan et al., "Characterization of Nanostructured ZnO Thin Films Deposited by Sol-Gel Spin Coating", Advanced Materials Research, Vols. 79-82, pp. 703-706, 2009

Online since:

August 2009

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Price:

$35.00

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