Preparation and Characterization of Lanthanum Self-Assembled Nano-Films

Abstract:

Lanthanum (La) nano-films prepared by a self-assembled technique on a silicone-based material surface, was studied by using an all-round functional Turbiscan LAB stability analyzer and X-ray fluorescence analysis (XRF) as well as atomic force microscope (AFM). La content introduced in the assembled nano-film reached a maximum at pH value between 5 and 6. In the preparation of colloidal sol, no phase separation took place at 60 °C where the colloidal particles uniformly and stably dispersed in the solution. The optimum topographic feature was observed after 24 hours, whence self-assembled process was performed. The particle dispersion of the assembled film was uniform and compact at the optimum EDTA to La molar ratio 0.5.

• Periodical: Advanced Materials Research (Volumes 79-82)
• Pages: 871-874
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.79-82.871
• Online since: August 2009
• Authors: Guo Xian Yu, Mo Bin Sun, Xiao Long Zhou, Cheng Lie Li, Li Fang Chen, Jin An Wang
• Keywords: Atomic Force Microscope (AFM), Lanthanum, Preparation, Self-Assembly Nano-Film

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