Fabrication and Characterization of Ferroelectric Thin Film BaxSr1-xTiO3 for Application in Light Intensity Detector

Anif Jamaluddin; Erna Susilowati; Sri Budiawanti; Yofentina Iriani

doi:10.4028/www.scientific.net/AMR.896.358

Paper Titles

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Fabrication and Characterization of Ferroelectric Thin Film Ba_xSr_1-xTiO₃for Application in Light Intensity Detector
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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 896Fabrication and Characterization of Ferroelectric...

Fabrication and Characterization of Ferroelectric Thin Film Ba_xSr_1-xTiO₃for Application in Light Intensity Detector

Abstract:

Ferroelectric thin film devices have been demonstrated using Ba_xSr_1-xTiO₃ (BST) as a light intensity detector. Various compositions of BST (x=0.7, 0.8 and 0.9) were prepared using Chemical Solution Deposition method. Solution of barium acetate, strontium acetate, titanium (IV) iso-propoxide in a mixture of acetic acid and ethylene glycol was spin-coated onto a silicon substrate. The BST film was annealed at 800°C. The microstructure and the crystalline characterization of BST were studied using X-Ray Diffraction (XRD) pattern with General Structure Analysis System (GSAS) refinement. The film thickness was measured using Scanning Electron Microscopy (SEM). The response of BST film to source of light intensity was investigated with IRC meter and resonator coupling. The results show that the resistance of a thin BST film decrease as the intensity of light increase. On resonator coupling, V_OUT shows a slight increases as the intensity of light increases.

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Advanced Materials Research (Volume 896)

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358-362

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https://doi.org/10.4028/www.scientific.net/AMR.896.358

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Online since:

February 2014

Authors:

Anif Jamaluddin*, Erna Susilowati, Sri Budiawanti, Yofentina Iriani

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Ba_xSr_1-xTiO₃, Chemical Solution Deposition, Light Intensity Detector

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