Noise Analysis and Characterization of a CMOS Interface Circuit for Fluxgate Sensor

Abstract:

In this paper, noise analysis and characterization of a 5V CMOS interface circuit for the fluxgate is presented, which is based on second-harmonic detection of the output voltage. The circuit consists of oscillator, band pass filter, phase sensitive demodulation, low pass filter. The chip is fabricated in the 0.5μm two–metal and two-poly n-well CMOS process with an area of 4 mm2. Experimental results shows, the system exhibits a sensitivity of 16.5μV/nT for a magnetic field range of ±90μT in open-loop with 5kHz excitation frequency. Using 5V supply voltage, the power consumption of the system is measured to be 35 mW.

• Periodical: Advanced Materials Research (Volume 981)
• Pages: 107-110
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.981.107
• Online since: July 2014
• Authors: Chang Chun Dong*, Zhan Peng Jiang
• Keywords: CMOS, Fluxgate Sensor, Interface Circuit

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