Particle Filter Approach for IGBT Remaining Useful Life

Min Li; Jiong Jiong Zhu; Bin Long

doi:10.4028/www.scientific.net/AMR.981.86

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 981Particle Filter Approach for IGBT Remaining Useful...

Particle Filter Approach for IGBT Remaining Useful Life

Abstract:

With the increasingly widespread application, the requirement for PHM of IGBT is becoming gradually urgent. Based on particle filter theory, a method for remaining useful life (RUL) prediction of IGBT is proposed. Firstly, the deterioration parameters on-state VCE and ICE are extracted by temperature cycling test, then a model is developed based on the degradation trend exhibited by deterioration parameters. In the end, PF approach is applied to the IGBT's RUL prediction with the mentioned model. The results show that the proposed prediction method can achieve high prediction accuracy.

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Periodical:

Advanced Materials Research (Volume 981)

Pages:

86-89

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.981.86

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Online since:

July 2014

Authors:

Min Li*, Jiong Jiong Zhu, Bin Long

Keywords:

Failure Prognosis, IGBT, Particle Filter, RUL

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