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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 200-202Residual Shallow Donor- and Acceptor-Impurities in...

Residual Shallow Donor- and Acceptor-Impurities in SSD- and LEC-Grown High-Purity InP Crystals

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Defects and Diffusion in Semiconductors IV

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Periodical:

Defect and Diffusion Forum (Volumes 200-202)

Pages:

67-96

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.200-202.67

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Online since:

November 2001

Authors:

E. Kubota, S. Yamada, Kotoji Ando

Keywords:

Annealing, Defect, Donors, FIR-PC, Impurity, InP, LEC, Passivation, PL, SSD

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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