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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 221-223A Finite Difference Calculation of Impurity...

A Finite Difference Calculation of Impurity Migration in Semiconductors by the Kick-Out Mechanism

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Defects and Diffusion in Semiconductors VI

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Periodical:

Defect and Diffusion Forum (Volumes 221-223)

Pages:

89-108

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.221-223.89

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Online since:

November 2003

Authors:

A. Benmakhlouf

Keywords:

Diffusion, Finite Difference, Kick-Out Mechanism, Profile, Reaction-Diffusion, Surface Effects

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© 2003 Trans Tech Publications Ltd. All Rights Reserved

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