A Finite Difference Calculation of Impurity Migration in Semiconductors by the Kick-Out Mechanism

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Periodical:

Defect and Diffusion Forum (Volumes 221-223)

Edited by:

D.J. Fisher

Pages:

89-108

DOI:

10.4028/www.scientific.net/DDF.221-223.89

Citation:

A. Benmakhlouf "A Finite Difference Calculation of Impurity Migration in Semiconductors by the Kick-Out Mechanism ", Defect and Diffusion Forum, Vols. 221-223, pp. 89-108, 2003

Online since:

November 2003

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$35.00

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