Imaging and Characterizing Nanoscale Fluctuations in the Distribution of Dopant Atoms by Scanning Tunneling Microscopy

Abstract:

Article Preview

Info:

Periodical:

Defect and Diffusion Forum (Volumes 230-232)

Edited by:

David J. Fisher

Pages:

111-124

DOI:

10.4028/www.scientific.net/DDF.230-232.111

Citation:

P. Ebert "Imaging and Characterizing Nanoscale Fluctuations in the Distribution of Dopant Atoms by Scanning Tunneling Microscopy ", Defect and Diffusion Forum, Vols. 230-232, pp. 111-124, 2004

Online since:

November 2004

Authors:

Export:

Price:

$35.00

In order to see related information, you need to Login.