Effect of Post-Deposition Annealing on some Optical Properties of Thermally-Evaporated V₂O₅ Thin Film

Abstract:

A Vanadium Pentoxide Sample with a Film Thickness of 75 Nm Has Been Thermally Evaporated on Unheated Glass Substrate Using V₂O₅ High Purity Powder. the Sample Was Subjected to a Subsequent Post-Deposition Annealing in Air at Different Temperatures for a Period of One Hour. the Optical Properties Were Studied by Transmittance and Reflectance Measurements. the Integrated Visible ,T_Vis, and Solar, T_Sol, Transmittance Were Calculated. the Spectral Behaviour of the Refractive Index as Well as the Absorption Coefficient before and after Post-Deposition Heat-Treatment Was Also Reported. X-Ray Diffraction Confirmed that the Film in the as-Deposited as Well as after Annealing up to 400 °C Is in the Amorphous State.

• Periodical: Defect and Diffusion Forum (Volume 329)
• Pages: 139-145
• DOI: https://doi.org/10.4028/www.scientific.net/DDF.329.139
• Online since: July 2012
• Authors: S.A. Aly
• Keywords: Annealing, Optical Property, Thin Film, Vacuum Evaporation, Vanadium Pentoxide (V₂O₅)

References

[1] A. Z. Moshfegh and A. Ignatiev. Thin Solid Films, 198 (1991) 251.

[2] D. M. Mattox and G. J. Kominiak,: Journal of Vacuum Science and Technology, 12(1) (1975) 182.

[3] C. M. Lampert and C. G. Granqvist, Eds, Large area Chromogenics: Materials and devices for transmittance control (SPIE, Bellingham, 1990).

DOI: 10.1117/12.2283605

[4] S.H. Lee, H.M. Cheong, M.J. Seong, P. Liu, C.E. Tracy, A. Mascarenhas, J.R. Pitts, S.K. Deb, Journal of Applied Physics, 92 (2002) 1893.

[5] S.H. Lee, H.M. Cheong, P. Liu, C.E. Tracy, Electrochemical Solid-State Letters, 6 (2003) A102.

[6] G.J. Fang, Z.L. Liu, Y. Wang, Y.H. Liu, K.L. Yao, Journal of Vacuum Science and Technology A, 19 (2001) 887.

[7] C. R. Aita, and Ying-Li Liu, Mei L. Kao and S. D. Hansen, Journal of Applied Physics, 60(2) (1986) 749.

[8] S. D. Hansen, and C. R. Aita, Journal of Vacuum Science and Technology A, 3 (1985) 660.

[9] M. S. R. Khan, K. A. Khan, W. Estrada, and C. G. Granqvist,: Journal of Applied Physics, 69 (1991) 3231.

[10] R.M. Wightman, Science, 240 (1988) 415.

[11] J. Livage, Chem. Mater, 3 (1991) 578.

[12] N. Özer: Thin Solid Films, 305 (1997) 80.

[13] C.G. Granqvist, C.M. Lampert, Science and Technology of Electrochromics, Optical Materials Technology for Energy Efficiency and Solar Energy, Toulouse, France, May, (1992).

[14] F. Demichelis, G. Kaniadakis, A. Tagliferro and E. Tresso:J. Appl. Optics, 26(1987)1737.

[15] H.R. Ryu, J.S. Park, K.J. Hong, K.S. Hwang, B.A. Kang and J.S. Oh, Surface & Coatings Technology, 173 (2003) 19.

[16] A Talledo, A M Andersson and C G Granqvist, Journal of Materials Research, 5(6) (1990) 1253.

[17] L. Bornstein, Numerical data and functional relationships in science and technology, New Series III/17g, 195 (1984).

[18] M. Benmoussa. E. Ibnouelghazi, A. Bennouna, E. L. Ameziane, Thin Solid Films, 265 (1995) 22.

DOI: 10.1016/0040-6090(95)06617-9

[19] A. Z. Moshfegh and A. Ignatiev, Thin Solid Films, 198 (1991) 251.

[20] J. C. Parker, D. J. Lam, Y-N. Xu and W. Y. Ching, Physical Review B, 42 (1990) 5289.

[21] J. Luksich, and C. R. Aita, Journal of Vacuum Science and Technology A, 9(3) (1991) 542.

[22] S. H. Soliman, N. El-Kadry, O. Jamjoum, M. M. El-Nahass, H. B. Darwish, 17 (1988) 46.

[23] O.S. Heavens" Optical Properties of Thin Films" Dover, New Yourk: Dover. 1965, p, 46 (1965); Thin film Physics, London Methuen, (1970).

[24] A. A. Akl, Journal of Physics and Chemistry of Solids, 71 (2010) 223.