Formation and Characterization of Nanolayered Pd-Based Metal/p-4H SiC Systems with Ohmic Behaviour

Abstract:

Three types of nanolayered Pd-based metal/p-4H SiC systems, Au/Pd, Au/Pd/Al and Au/Pd/Ti/Pd have been investigated and compared to Pd monolayered metallization regarding the electrical and thermal properties. The lowest contact resistivity of 2.8x10-5 .cm2 has been achieved with the Au/Pd/Ti/Pd contact. This contact exhibits excellent thermal stability during long-term heating at temperature of 700oC and at operating temperatures up to 450oC. The surface morphology investigation has shown that despite the observed decrease, the palladium agglomeration has been not avoided completely in the same contact. The dominated surface roughness was measured to be 75 nm. However, the formation of dendrites in certain places leads to increase the surface roughness to 125 nm. The structural analysis revealed that palladium silicides are formed at the interface metal/p-4H SiC which affects on decrease of the barrier height in more than two times and conversion of the contact from Schottky into ohmic.

• Periodical: Journal of Nano Research (Volume 10)
• Pages: 77-85
• DOI: https://doi.org/10.4028/www.scientific.net/JNanoR.10.77
• Online since: April 2010
• Authors: Lilyana Kolaklieva, Roumen Kakanakov, Efstathios K. Polychroniadis, Eleni Pavlidou, Ioannis Tsiaousis, Bensely Albert, Ariadne Andreadou
• Keywords: Atomic Force Microscope (AFM), Contact Resistivity, Ohmic Contact, Scanning Electron Microscope (SEM), Surface Morphology, TEM, Thermal Stability

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