Surface Plasmon Resonance Effect on the Optical Properties of TiO₂ Doped by Noble Metals Nanoparticles

Abstract:

Nanocomposite thin films composed of a TiO₂ matrix doped with noble metals nanoparticles (MNPS), Au and Ag, were deposited on Si (100) and glass substrates by dc magnetron sputtering. The samples were annealed in a protective atmosphere at temperatures ranging from 200 to 700 °C. The main goal of this work is to characterize and compare the Surface Plasmon Resonance (SPR) behaviour in both systems. The studies have been focused on the growth of the nanoclusters and on their role on the optical properties of the films. Size, shape and distribution of the nanoclusters embedded on the titanium oxide dielectric matrix are reported as key factors on the SPR behaviour in both systems (Au:TiO₂ and Ag:TiO₂). The MNPs grew due to diffusion mechanisms, which were led by the annealing treatments, even at the highest annealing temperatures. Evidences of the correlation between the nanocomposite film structural changes and the evolution of the optical properties due to the SPR activity are reported. The SPR phenomenon manifests itself as a wide band on the visible range on the absorption spectra, and it is confirmed by an important change on the surface colour tones of the samples.

• Periodical: Journal of Nano Research (Volumes 18-19)
• Pages: 177-185
• DOI: https://doi.org/10.4028/www.scientific.net/JNanoR.18-19.177
• Online since: July 2012
• Authors: M. Torrell, R.C. Adochite, L. Cunha, N.P. Barradas, E. Alves, M.F. Beaufort, Jean Paul Rivière, Albano Cavaleiro, Sergi Dosta, F. Vaz
• Keywords: Magnetron Sputtering, Nanocomposite, Physical Vapour Deposition, Surface Plasmon Resonance (SPR)

References

[1] E. Hutter, J.H. Fendler, Adv. Mater. 16, 1685 (2004).

[2] A. Moores, F. Goettmann, New J. Chem. 30, 1121 (2006).

[3] G. Walters, I.P. Parkin, J. Mater. Chem. 19, 590 (2009).

[4] S. H Cho, S. Lee, D.Y. Ku, T.S. Lee, B. Cheong, W.M. Kim, K.S. Lee, Thin solid films. 447, 68 (2004).

DOI: 10.1016/j.tsf.2003.09.024

[5] L.M. Liz-Marzán, Mater. Today. 7(2), 31(2004).

[6] H.B. Liao, R.F. Xiao, J.S. Fu, H. Wang, K.S. Wong, and G.K.L. Wong. Opt. Lett. 23(5), 388 (1998).

[7] T. Yamamoto, K. Machi, S. Nagare, K. Hamada, M. Senna, Solid State Ionics 172, 299 (2004).

[8] K.C. Lee, S.J. Lin, C.H. Lin, C.S. Tsai, Y.J. Lu, Surf. Coat. Technol. 202, 5339 (2008).

[9] J.Y. Kim, H.S. Jung, J.H. No, J.R. Kim, K.S. Hong, J. Electroceram. 16, 447 (2006).

[10] A. Fujishima, X. Zhang, D.A. Tryk, Surf. Sci. Rep. 63, 515 (2008).

[11] M. Lee, L. Chae, K.C. Lee, Nanostruct. Mater. 11(2), 195 (1999).

[12] P. Carvalho, J.M. Chappé, L. Cunha, S. Lanceros-Méndez, P. Alpuim, F. Vaz, E. Alves, C. Rousselot, J.P. Espinós, A.R. González-Elipe, J. Appl. Phys. 103, 104907 (2008).

DOI: 10.1063/1.2927494

[13] N.P. Barradas, C. Jeynes, R.P. Webb, Appl. Phys. Lett. 71, 291 (1997).

[14] M. Torrell, P. Machado, L. Cunha, N.M. Figueiredo, J.C. Oliveira, C. Louro, F. Vaz, Surf. Coat. Technol. 204, 1569 (2010).

[15] M. Torrell, L. Cunha, A. Cavaleiro, E. Alves, N.P. Barradas, F. Vaz, Appl. Surf. Sci. 256, 6536 (2010).

[16] Colorimetry, CIE Publ. 1971 (Commission Internationale de L'Éclairage).

[17] Recommendations on Uniform Color Spaces, Difference-difference equations, psychometric colour terms, CIE Publication (Commission Internationale de L'Éclairage) 1978 2-70 15.

[18] M. Torrell, L. Cunha, M.R. Kabir, A. Cavaleiro, M.I. Vasilevskiy, F. Vaz. Mater. Let. 64, 2624 (2010).

[19] M. Torrell, M.R. Kabir, L. Cunha, M.I. Vasilevskiy, A. Cavaleiro, E. Alves, N.P. Barradas, F. Vaz, J. Appl. Phys. (2011), DOI: 10. 1063/1. 356506.

[20] M.I. Vasilevskiy, E.V. Anda, Phys. Rev. B. 54, 5844 (1996).

[21] M.I. Vasilevskiy, Phys. Stat. Sol. B. 219, 197 (2000).

[22] M. Fujii, S. Hayashi, K. Yamamoto. Jpn. J. Appl. Phys. 30, 687 (1991).

[23] M. Lifshitz, V.V. Slyozov, J. Phys. Chem. Solids 19, 35(1961).

[24] E. Alves, N. Franco, N.P. Barradas, B. Nunes, J. Lopes, A. Cavaleiro, M. Torrell, L. Cunha, F. Vaz, Nucl. Instr. and Meth. in Phys. Res. B (2011), doi: 10. 1016/j. nimb. 2011. 01. 033.

[25] M. Lee, L. Chae, K.C. Lee. Nanostruct. Mater., 11, 195(1999).

[26] D. Buso, J. Pacifico, A. Martucci, P. Mulvaney, Adv. Funct. Mater, 17, 347 (2007).

[27] J. Kim, H. Jung, J. No, J.R. Kim, K. Hong, J. Electroceram. 16, 447 (2006).

[28] D. Mergel, D. Buscendorf, S. Eggert, R. Grammes, B. Samset, Thin Solid Films 371, 218 (2000).

DOI: 10.1016/s0040-6090(00)01015-4

[29] G.B. Song, J.K. Liang, F.S. Liu, T.J. Peng, G.H. Rao, Thin Solid Films 491, 110 (2005).

[30] G. Mie. Ann. Phys. 25, 377(1908).

[31] J. Wang, W.M. Lau, Q. Li, J. Appl. Phys. 97(11), 114303 (2005).

[32] D. Dalacu, L. Martinu, J. Appl. Phys. 87(1), 228 (2000).

[33] J. Okumu, C. Dahmen, A.N. Sprafke, M. Luysberg, G. von Plessen, M. Wuttig, Appl. Phys. 97, 094305 (2005).

DOI: 10.1063/1.1888044

[34] C. Sella, S. Chenot, V. Reillon, S. Berthier, Thin Solid Films. 517, 5848 (2009).

DOI: 10.1016/j.tsf.2009.03.060