Paper Titles

Recent Development of Oxide Thermoelectric Device
p.81

Effects of Doping on Thermoelectric Properties of Rare-Earth Cobalt Oxides
p.87

Electric Fatigue and Leakage Characteristics in Sn Modified Lead Zirconate Titanate Thin Films
p.95

Effects of the Surface Compositions on Electrical Properties of Pb(Zr,Ti)O₃ Thin Films
p.101

Effects of Thickness on the Structures and the Properties of Lead Titanate Thin Films
p.105

Effects of Buffer Layers on Electrical Properties of Pb(Zr,Ti)O₃ Thin Films Derived by Metalorganic Decomposition
p.111

Microstructures and Electrical Characteristics of PZT Thin Films Deposited on Stainless Steel Using a LaNiO₃ Buffer Layer
p.117

Frequency Dependence of P-E Hysteresis Curves in PZT Thin Films
p.123

Effect of Ti Source on Preparation of Pb-Based Oxide Thin Films Using LSCVD
p.129

HomeKey Engineering MaterialsKey Engineering Materials Vols. 214-215Effects of Thickness on the Structures and the...

Effects of Thickness on the Structures and the Properties of Lead Titanate Thin Films

Article Preview

Abstract:

You might also be interested in these eBooks

Asian Ceramic Science for Electronics I

Info:

Periodical:

Key Engineering Materials (Volumes 214-215)

Pages:

105-110

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.214-215.105

Citation:

Cite this paper

Online since:

July 2001

Authors:

De Sheng Fu, Hisao Suzuki, Kenji Ishikawa

Keywords:

Atomic Force Microscope (AFM), Dielectric Constant, Ferroelectric Thin Film, Lattice Constant, Lead Titanate, Raman Scattering, X-Ray Diffraction (XRD)

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2002 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: