Paper Titles

Effects of the Surface Compositions on Electrical Properties of Pb(Zr,Ti)O₃ Thin Films
p.101

Effects of Thickness on the Structures and the Properties of Lead Titanate Thin Films
p.105

Effects of Buffer Layers on Electrical Properties of Pb(Zr,Ti)O₃ Thin Films Derived by Metalorganic Decomposition
p.111

Microstructures and Electrical Characteristics of PZT Thin Films Deposited on Stainless Steel Using a LaNiO₃ Buffer Layer
p.117

Frequency Dependence of P-E Hysteresis Curves in PZT Thin Films
p.123

Effect of Ti Source on Preparation of Pb-Based Oxide Thin Films Using LSCVD
p.129

Characteristics of Sputtered Lead Barium Zirconate Thin Films
p.133

Preparation and Ferroelectric Properties of CaBi₂Ta₂O₉/BaBi₂Ta₂O₉ Thin Films on Pt-Passivated Silicon
p.139

Control of Crystal Structure of SrBi₂Ta₂O₉ Thin Films by UV Irradiation
p.145

HomeKey Engineering MaterialsKey Engineering Materials Vols. 214-215Frequency Dependence of P-E Hysteresis Curves in...

Frequency Dependence of P-E Hysteresis Curves in PZT Thin Films

Article Preview

Abstract:

You might also be interested in these eBooks

Asian Ceramic Science for Electronics I

Info:

Periodical:

Key Engineering Materials (Volumes 214-215)

Pages:

123-128

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.214-215.123

Citation:

Cite this paper

Online since:

July 2001

Authors:

Takaaki Tsurumi, Song Min Nam, Young Bae Kil, Satoshi Wada

Keywords:

Domain Structure, Ferroelectric, Ferroelectric Memory, PZT, Thin Film

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2002 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: