Microstructures and Electrical Characteristics of PZT Thin Films Deposited on Stainless Steel Using a LaNiO3 Buffer Layer

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Periodical:

Key Engineering Materials (Volumes 214-215)

Edited by:

M. Murata, K. Koumoto and T. Takenaka, S. Fujitsu

Pages:

117-122

DOI:

10.4028/www.scientific.net/KEM.214-215.117

Citation:

Y. Liu and C. N. Xu, "Microstructures and Electrical Characteristics of PZT Thin Films Deposited on Stainless Steel Using a LaNiO3 Buffer Layer", Key Engineering Materials, Vols. 214-215, pp. 117-122, 2002

Online since:

July 2001

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$35.00

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