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HomeKey Engineering MaterialsKey Engineering Materials Vols. 214-215Microstructures and Electrical Characteristics of...

Microstructures and Electrical Characteristics of PZT Thin Films Deposited on Stainless Steel Using a LaNiO₃ Buffer Layer

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Asian Ceramic Science for Electronics I

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Periodical:

Key Engineering Materials (Volumes 214-215)

Pages:

117-122

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.214-215.117

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Online since:

July 2001

Authors:

Yun Liu, Chao Nan Xu

Keywords:

LaNiO₃, Orientation, PZT, Steel, Thin Film

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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