Very Low Frequency Dielectric Relaxation Deduced from Time Domain Measurements

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Key Engineering Materials (Volumes 230-232)

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Teresa Vieira

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579-582

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E. R. Neagu et al., "Very Low Frequency Dielectric Relaxation Deduced from Time Domain Measurements", Key Engineering Materials, Vols. 230-232, pp. 579-582, 2002

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October 2002

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