Very Low Frequency Dielectric Relaxation Deduced from Time Domain Measurements

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Periodical:

Key Engineering Materials (Volumes 230-232)

Edited by:

Teresa Vieira

Pages:

579-582

DOI:

10.4028/www.scientific.net/KEM.230-232.579

Citation:

E. R. Neagu et al., "Very Low Frequency Dielectric Relaxation Deduced from Time Domain Measurements", Key Engineering Materials, Vols. 230-232, pp. 579-582, 2002

Online since:

October 2002

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$35.00

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