Very Low Frequency Dielectric Relaxation Deduced from Time Domain Measurements

Eugen R. Neagu; José N. Marat-Mendes; C.J. Dias; Rodica M. Neagu

doi:10.4028/www.scientific.net/KEM.230-232.579

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Very Low Frequency Dielectric Relaxation Deduced from Time Domain Measurements

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Key Engineering Materials (Volumes 230-232)

Pages:

579-582

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.230-232.579

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Online since:

October 2002

Authors:

Eugen R. Neagu, José N. Marat-Mendes, C.J. Dias, Rodica M. Neagu

Keywords:

Dielectric Relaxation, Time Domain Spectroscopy, Very Low Frequency Dispersion

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References

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