Structural Characterisation of Zinc Oxide Thin Films Produced by Spray Pyrolysis

Patrícia Nunes; Francisco Manuel Braz Fernandes; Rui Jorge C. Silva; Elvira Fortunato; Rodrigo Martins

doi:10.4028/www.scientific.net/KEM.230-232.599

Paper Titles

Influence of the Plasma Regime on the Structural, Optical and Transport Properties of a-Si:H Thin Films
p.583

Role of the i-Layer Thickness in the Performance of a-Si:H Schottky Barrier Photodiodes
p.587

Influence of Hydrogen Gas Dilution on the Properties of Silicon-Doped Thin Films Prepared by the Hot-Wire Plasma-Assisted Technique
p.591

Processing and Characterization of Ba-Based Layered Ferroelectric Relaxors
p.595

Structural Characterisation of Zinc Oxide Thin Films Produced by Spray Pyrolysis
p.599

Growth Model of Gas Species Produced by the Hot-Wire and Hot-Wire Plasma-Assisted Techniques
p.603

Study of PbTe Epitaxial Layers Grown Directly Over Silicon Wafers
p.607

Hard Nanocomposite Coatings Prepared by Magnetron Sputtering
p.613

Nanometer-Scale Multilayered Mo/Ti_0.4Al_0.6N Hard Coatings
p.623

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Structural Characterisation of Zinc Oxide Thin Films Produced by Spray Pyrolysis

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Key Engineering Materials (Volumes 230-232)

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599-602

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https://doi.org/10.4028/www.scientific.net/KEM.230-232.599

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Online since:

October 2002

Authors:

Patrícia Nunes, Francisco Manuel Braz Fernandes, Rui Jorge C. Silva, Elvira Fortunato, Rodrigo Martins

Keywords:

Crystallite Size, Electrical Resistivity, Spray Pyrolysis, Thin Film, Zinc Oxide (ZnO)

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