Residual Stress of Multilayer Ceramic Capacitors (MLCCs)

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Edited by:

T. Kimura, T. Takenaka, S. Fujitsu and K. Shinozaki

Pages:

179-182

DOI:

10.4028/www.scientific.net/KEM.248.179

Citation:

Y. Nakano et al., "Residual Stress of Multilayer Ceramic Capacitors (MLCCs)", Key Engineering Materials, Vol. 248, pp. 179-182, 2003

Online since:

August 2003

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[1] T. Nomura,S. Sumita,Y. Nakano,K. Nishiyama, Proc. 5thUS-l. japan Seminar on Dielectric and Piezoelectric Ceramics, (1990) 29-32.

[2] R. Waser,T. Baiatu and K. Hardtl, J. Am. Ceram. Soc., 3 (1990) 1645-1653.

[3] N. Fujikawa, NipponCeramiics Kyokai Denshizairyou-bukai, (1990) 86.

[4] H. Kabasawa,H. Saitoh, S. Tosaka, NEEDS&SEEDS, 10(1994)15-18.

[5] W. Carlson,T. Rutt,M. Wild, Ferroelectric Letters, 21(1996)1-9.

[6] H. Chazono, Y. Inomata, N. Kohzu and H. Kishi 㧦Key Engineering Materials Vols. 169-170(1999)31-34 e-mail: yukien@mb1. tdk. co. jp.

[7] 0.

[7] 5.

[8] 0.

[8] 5.

[9] 0.

[9] 5.

[10] 0.

[10] 5.

[11] 0 0 50 100 150 Temp. [C] �[uF] 0MPa 5MPa 25MPa 50MPa 100MPa 150MPa Thickness direction Fig. 7(a) Effect of the external stress in thickness direction on the temperature dependence of capacitance. 7. 0.

[7] 5.

[8] 0.

[8] 5.

[9] 0.

[9] 5.

[10] 0.

[10] 5.

[11] 0 0 50 100 150 Temp. [C] �[uF] 0MPa 5MPa 18MPa 41MPa 100MPa 182MPa Width direction Fig. 7( � ) Effect of the external stress in width direction on the temperature dependence of capacitance. -10 -8 -6 -4 -2 0 2 4.

01 0. 1 1 10 100 dc-bias[V] �apacitance change [%] 10 layers 50 layers 200 layers Fig. 8 Effect of dc-bias on capacitance change of MLCCs with various numbers of layers.

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