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HomeKey Engineering MaterialsKey Engineering Materials Vol. 301Investigation of Domain Structure and Electrical...

Investigation of Domain Structure and Electrical Properties of Monoclinic Epitaxial Zirconia Buffer Layer

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Electroceramics in Japan VIII

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Periodical:

Key Engineering Materials (Volume 301)

Pages:

261-264

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.301.261

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Online since:

January 2006

Authors:

Takanori Kiguchi, Naoki Wakiya, Kazuo Shinozaki, Nobuyasu Mizutani

Keywords:

Buffer Layer, C-V Characteristics, Domain Structure, Interface-Trapped Charge, Monoclinic Phase, Oxide-Trapped Charge, Tetragonal Phase, Zirconia

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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DOI: 10.1016/0040-6090(92)90617-k

[10] J.C. Wang, S.H. Chiao, C.L. Lee, T.F. Lei, Y.M. Lin, M.F. Wang, S.C. Chen, C.H. Yu, and M.S. Liang, J. Appl. Phys., 92 (2002) , p.3936 e-mail: tkiguchi@cama. titech. ac. jp Fax: 03-5734-3360, http: /www. cama. titech. ac. jp.