Characterization and Manipulation of Boron Nanowire inside SEM

Ming Chang; C.H. Lin; Juti Rani Deka

doi:10.4028/www.scientific.net/KEM.381-382.31

Paper Titles

Reliable Detection of Periodic Micro Structures on Open Surfaces
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Simulation of Light Scattering from Nanostructured Surfaces
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Characterization and Manipulation of Boron Nanowire inside SEM
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AFM with the Slope Compensation Technique for High-Speed Precision Measurement of Micro-Structured Surfaces
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Compact Displacement Measurement System Based on Microchip Nd:YAG Laser with Birefringence External Cavity
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New Synthetic Heterodyne Laser Doppler Vibrometer for Measurement of Mechanical Vibrations with Submicron Amplitude
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Development of the Precision Stage with Nanometer Accuracy and a Millimeter Dynamic Range
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HomeKey Engineering MaterialsKey Engineering Materials Vols. 381-382Characterization and Manipulation of Boron...

Characterization and Manipulation of Boron Nanowire inside SEM

Abstract:

Nanostructures materials have stimulated broad attention in the past decade because of their potential fundamental characteristics and its promising applications in nano electronic devices. In the present investigation, crystalline boron nanowires (BNWs) were synthesized by vapor liquid solid (VLS) technique and its mechanical properties were studied using a nanomanipulator inside a scanning electron microscope (SEM). Electron beam induced deposition (EBID) method was used to clamp boron nanowire to the AFM tips. The Young’s modulus of the NWs were determined from the buckling instability of NW and computed to be approximately 131.7 ± 14.6GPa. In addition, the nanomanipulation system was used to manipulate nanowire and built a nanoring.

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Periodical:

Key Engineering Materials (Volumes 381-382)

Pages:

31-34

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.381-382.31

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Online since:

June 2008

Authors:

Ming Chang, C.H. Lin, Juti Rani Deka

Keywords:

Boron Nanowire, Buckling, EBID, Nanomanipulation, Nanoring, Scanning Electron Microscope (SEM), TEM

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