Extrinsic Scaling Effects on the Dielectric Response of Grained BaTiO3 Films

Li Ben Li; Li Qiu Su; Zhi Qiang Zhen; Xin Zhong Li; Qing Dong Chen; Tong Wei Li

doi:10.4028/www.scientific.net/KEM.434-435.293

Paper Titles

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Ferroelectric Properties and Microstructures of Pr₆O₁₁-Doped Bi₄Ti₃O₁₂ Thin Films
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Dielectric Characteristics of the Lead-Free Piezoelectric Ceramics K_0.50Na_0.50Nb_0.95Ta_0.05O₃
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The Influence of Annealing Treatment on Physics and Electrical Characteristics of Ba(Zr_0.1Ti_0.9)O₃ Ferroelectric Films on ITO/Glass Substrate
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Extrinsic Scaling Effects on the Dielectric Response of Grained BaTiO₃ Films
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Bi₄Ti₃O₁₂ and Bi_3.25La_0.75Ti₃O₁₂ Thin Films Prepared by RF Magnetron Sputtering
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Effect of Cooling Rate on the Properties of the Grain Boundary of CaCu₃Ti₄O₁₂ Ceramic
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Memory Properties of SrBi₂Ta₂O₉/ Ba(Zr_0.1Ti_0.9)O₃ Thin Films Prepared on Si Substrate
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HomeKey Engineering MaterialsKey Engineering Materials Vols. 434-435Extrinsic Scaling Effects on the Dielectric...

Extrinsic Scaling Effects on the Dielectric Response of Grained BaTiO₃ Films

Abstract:

A set of gradient stresses is used in Landau thermodynamic theory to explain the dielectric diffusion of BaTiO3 films grown on thick copper foils. Every grain in the films is treated as a single domain core that is surrounded by boundaries with low dielectric constant. The dielectric diffusion is mainly induced by the diffusive phase transition caused by the gradient stresses. The low dielectric constant boundaries suppress the peak value of the dielectric constant. The results agree with the experiments.

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Key Engineering Materials (Volumes 434-435)

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293-295

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https://doi.org/10.4028/www.scientific.net/KEM.434-435.293

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Online since:

March 2010

Authors:

Li Ben Li, Li Qiu Su, Zhi Qiang Zhen, Xin Zhong Li, Qing Dong Chen, Tong Wei Li

Keywords:

Dielectric Constant, Ferroelectric, Grain Size, Thin Film

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