Computed Tomography for Application in Manufacturing Metrology

Abstract:

Article Preview

As a rather new technology, X-Ray Computed Tomography offers new and promising possibilities in manufacturing metrology in comparison to well-established tactile or optical measurements. The main benefit is the volumetric model which results of each measurement and represents the measurement object holistically with high point density.

Info:

Periodical:

Edited by:

Yuri Chugui, Yongsheng Gao, Kuang-Chao Fan, Roald Taymanov and Ksenia Sapozhnikova

Pages:

73-78

DOI:

10.4028/www.scientific.net/KEM.437.73

Citation:

A. Weckenmann and P. Krämer, "Computed Tomography for Application in Manufacturing Metrology", Key Engineering Materials, Vol. 437, pp. 73-78, 2010

Online since:

May 2010

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Price:

$35.00

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