Computed Tomography for Application in Manufacturing Metrology
As a rather new technology, X-Ray Computed Tomography offers new and promising possibilities in manufacturing metrology in comparison to well-established tactile or optical measurements. The main benefit is the volumetric model which results of each measurement and represents the measurement object holistically with high point density.
Yuri Chugui, Yongsheng Gao, Kuang-Chao Fan, Roald Taymanov and Ksenia Sapozhnikova
A. Weckenmann and P. Krämer, "Computed Tomography for Application in Manufacturing Metrology", Key Engineering Materials, Vol. 437, pp. 73-78, 2010