Computed Tomography for Application in Manufacturing Metrology

Albert Weckenmann; Philipp Krämer

doi:10.4028/www.scientific.net/KEM.437.73

Paper Titles

Nanorelief Measurements Errors for a White-Light Interferometer with Chromatic Aberrations
p.51

Fabrication of Large Grating by Monitoring the Latent Fringe Pattern
p.56

Design and Analysis of a 6-DOF Monolithic Nanopositioning Stage
p.61

In Situ Mechanical Property Measurement of Titania Nanowires
p.66

Computed Tomography for Application in Manufacturing Metrology
p.73

Achieving Traceability of Industrial Computed Tomography
p.79

Developments in Homodyne Interferometry
p.84

Development of Innovative Fringe Locking Strategies for Vibration-Resistant White Light Vertical Scanning Interferometry (VSI)
p.89

Compensation of Tilt Angles and Verification of Displacement Measurements with a Fabry-Perot Interferometer
p.95

HomeKey Engineering MaterialsKey Engineering Materials Vol. 437Computed Tomography for Application in...

Computed Tomography for Application in Manufacturing Metrology

Abstract:

As a rather new technology, X-Ray Computed Tomography offers new and promising possibilities in manufacturing metrology in comparison to well-established tactile or optical measurements. The main benefit is the volumetric model which results of each measurement and represents the measurement object holistically with high point density.

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Periodical:

Key Engineering Materials (Volume 437)

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73-78

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.437.73

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Online since:

May 2010

Authors:

Albert Weckenmann, Philipp Krämer

Keywords:

Coordinate Metrology, Manufacturing Metrology, X-Ray Computed Tomography

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References

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