Preparation and Characterization of BiFeO₃ Film via Sol-Gel Spin-Coating Process

Abstract:

BiFeO₃ thin films were spin-coated on conductive indium tin oxide (ITO)/glass substrates by a simple sol-gel possess annealed at 470-590°C. The crystal structure of as-prepared BiFeO₃ thin films annealed at different temperature was determined to be rhombohedral of R3m space and free of secondary phases was also confirmed. Cross section scanning electron microscope (SEM) pictures revealed that the thickness of BiFeO₃ thin film was about 320 nm. The double remanent polarization 2P_r of BiFeO₃ thin film annealed at 500°C is 2.5 μC/cm² without applied field at room temperature. Image of atomic force microscopy indicated that the root-mean-square surface roughness value of BiFeO₃ thin film was 6.13 nm.

• Periodical: Key Engineering Materials (Volume 492)
• Pages: 202-205
• DOI: https://doi.org/10.4028/www.scientific.net/KEM.492.202
• Online since: September 2011
• Authors: Xi Wei Qi, Xiao Yan Zhang, Xuan Wang, Hai Bin Sun, Jian Quan Qi
• Keywords: BiFeO₃ film, Sol-Gel (SG), Spin Coating

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