An In Situ Measuring Method for Young's Modulus of a MEMS Film Base on Resonance Frequency

Han Chen; Hua Rong

doi:10.4028/www.scientific.net/KEM.503.308

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HomeKey Engineering MaterialsKey Engineering Materials Vol. 503An In Situ Measuring Method for Young's Modulus of...

An In Situ Measuring Method for Young's Modulus of a MEMS Film Base on Resonance Frequency

Abstract:

Large-scale measurement of material property is not suit for the MEMS thin-film. Research the in-situ measuring method for material property of the MEMS thin-film is urgently. A center-anchored circular plate is adopted as the test structure here. The resonance frequency of the circular plate is measured to extract the Young’s modulus of a MEMS thin-film. The accuracy of this non-contact in-situ measuring method has been verified by CoventorWare. The inferences of the stress gradient have been analyzed. The advantages of the test structure and the measuring method present here also have been discussed.

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Periodical:

Key Engineering Materials (Volume 503)

Pages:

308-311

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.503.308

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Online since:

February 2012

Authors:

Han Chen, Hua Rong

Keywords:

Center-Anchored Circular Plate, Resonance Frequency, Young's Modulus

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