Symmetric Distortion Correction in Asphere Manufacturing

Jian Zhang; Lei Dai

doi:10.4028/www.scientific.net/KEM.552.158

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HomeKey Engineering MaterialsKey Engineering Materials Vol. 552Symmetric Distortion Correction in Asphere...

Symmetric Distortion Correction in Asphere Manufacturing

Abstract:

A method of symmetric distortion correction is described and successfully applied to correct the distortion mapping errors caused by CGH as well as internal imaging optics. The aspheric surface is 160 mm in diameter and has a maximum departure of 145 μm. According to the model established by the fiducial spots on the aspheric surface, we show experimental results after direct measurement and distortion-corrected error map respectively. The results show that the method of symmetric distortion correction is useful and effective.

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Periodical:

Key Engineering Materials (Volume 552)

Pages:

158-161

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.552.158

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Online since:

May 2013

Authors:

Jian Zhang, Lei Dai

Keywords:

Aspheric Surface, Correction, Distortion, Symmetric

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References

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