Dislocation Contrast Analysis in Weak Beam Synchrotron X-Ray Topography

Hong Yu Peng; Ze Yu Chen; Yafei Liu; Qian Yu Cheng; Shanshan Hu; Xian Rong Huang; Lahsen Assoufid; Balaji Raghothamachar; Michael Dudley

doi:10.4028/p-u7m9jr

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HomeMaterials Science ForumMaterials Science Forum Vol. 1062Dislocation Contrast Analysis in Weak Beam...

Dislocation Contrast Analysis in Weak Beam Synchrotron X-Ray Topography

Abstract:

Synchrotron monochromatic beam X-ray topography has been widely applied to characterize structural defects in SiC crystals. Using ray tracing simulations, the dislocation contrast in X-ray topography under strong diffraction conditions (diffraction takes place at or near Bragg angle) has been intensively investigated. However, the contrast and the configurations of the dislocation images recorded under weak diffraction conditions have not been fully investigated. Recently, we demonstrated that the contrast of dislocations in synchrotron grazing incidence topography under weak diffraction conditions can also be analyzed and interpreted by applying ray tracing principles. In this study, we have extended the application of the ray tracing method to analyze the dislocation contrast in weak beam synchrotron back reflection and rocking curve topography. The ray tracing method is shown to successfully simulate and correlate the contrast of threading screw dislocations at various positions on the rocking curve and thus allow to determine the signs of Burgers vectors.

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Periodical:

Materials Science Forum (Volume 1062)

Pages:

356-360

DOI:

https://doi.org/10.4028/p-u7m9jr

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Online since:

May 2022

Authors:

Hong Yu Peng*, Ze Yu Chen, Yafei Liu, Qian Yu Cheng, Shanshan Hu, Xian Rong Huang, Lahsen Assoufid, Balaji Raghothamachar, Michael Dudley

Keywords:

Dislocation Contrast, Weak Beam Topography, X-Ray Topography

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