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Investigating the Narrowing Effect in Muon Spin Relaxation within Fluctuating Magnetic Fields: A Strong Collision Model Approach

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Abstract:

We present our recent findings on the narrowing effect observed in muon spin relaxation within fluctuating magnetic fields, with a particular focus on muon diffusion in a background of random fields. Utilizing a strong collision model framework, we explore muon diffusion in a random Voigtian magnetic field and introduce a novel parameter to characterize the narrowing effect on the muon spin resonance (μSR) line shape. For the first time, we computationally demonstrate that the narrowing effect depends on the ratio of the Lorentzian half-width at half-maximum (HWHM) to the Gaussian HWHM. Our results indicate that increasing the Lorentzian HWHM reduces the rate of the narrowing effect, leading to a saturation regime characterized by an exponential relaxation function. When the Lorentzian contribution is sufficiently high, the motional narrowing effect disappears. This transition is marked by a sign change in our defined parameter from positive to negative values. Furthermore, we extend our study to La1.976Sr0.024CuO4 at 200 K, where our analysis reveals that muon diffusion occurs in the presence of a static Gaussian nuclear dipole field, while the static Lorentzian field remains absent. These findings underscore the importance of considering both muon diffusion and fluctuating fields in the interpretation of μSR spectra. Our study provides significant insights into muon behavior in complex magnetic environments, particularly in materials exhibiting spin glass states or mixed magnetic interactions, contributing to a broader understanding of magnetic field interactions at the microscopic level.

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Periodical:

Materials Science Forum (Volume 1152)

Pages:

55-63

DOI:

https://doi.org/10.4028/p-SIhkL3

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Online since:

June 2025

Authors:

Muhamad Darwis Umar*, Henokh Lugo Hariyanto

Keywords:

Muon Spin Relaxation, Narrowing Effect, Strong Collision Model, Voigtian Distribution

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© 2025 Trans Tech Publications Ltd. All Rights Reserved

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