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HomeMaterials Science ForumMaterials Science Forum Vols. 143-147The Influence of Process-Induced Surface Defects...

The Influence of Process-Induced Surface Defects on Luminescence and Transport Properties of Low-Dimensional Structures

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Defects in Semiconductors 17

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Periodical:

Materials Science Forum (Volumes 143-147)

Pages:

1541-1546

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.143-147.1541

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Online since:

October 1993

Authors:

P. Emanuelsson, I. Maximov, H. Linke, P. Omling, L. Samuelson, B.K. Meyer

Keywords:

Dangling Bond, EPR, MORIE, Photoluminescence (PL), Shubnikov-de Haas, Single-Particle Relaxation Time

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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